Polarization-dependent Raman spectra of heteroepitaxial (Ba,Sr)TiO3/MgO thin films

• Type: Article in International Scientific Journal
• Date: 2002

Authors

Yuzyuk, YI (Author) Other; Alyoshin, VA (Author) Other; Zakharchenko, IN (Author) Other; Sviridov, EV (Author) Other; Almeida, A (Author) FCUP; Chaves, MR (Author) FCUP

Journal

Title: Physical Review B

Vol. 65

Pages: 1341071-1341079

ISSN: 2469-9950

Publisher: American Physical Society

Indexing

ISI Web of Knowledge - 44 Citations

Scopus - 46 Citations

Other information

Authenticus ID: P-000-PYH

DOI: 10.1103/physrevb.65.134107

Abstract (EN): We have studied the concentration dependence of the Raman spectra of heteroepitaxial (Ba1-xSrx)TiO3 (BST) (x=0, 0.15, 0.30, and 0.45) thin films deposited by rf sputtering on (001) MgO substrates. It is found that substitution of Ba by Sr leads to the distortions of the Ti-O bonds and causes the appearance of new bands in the Raman spectra near the bands corresponding to the Ti-O vibrations. The Sr incorporation induces relatively large shifts of the low-frequency Raman peaks attributed to E-TO and A(1 TO) components of the soft mode. The E-TO soft mode in BST films becomes underdamped for xgreater than or equal to0.3 and is very sensitive to the two-dimensional compressive stresses.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 9