Functional in-circuit characterisation of Sigma Delta modulators

• Type: Article in International Scientific Journal
• Date: 2002

Authors

José Alfredo Ribeiro da Silva Matos (Author) FEUP; José Alberto Peixoto Machado da Silva (Author) FEUP; Jorge Duarte (Author) Other

Journal

Title: Measurement: Journal of the International Measurement Confederation

Vol. 32 No. 4

Pages: 257-264

ISSN: 0263-2241

Publisher: Elsevier

Indexing

ISI Web of Knowledge - 1 Citation

Scopus - 1 Citation

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences > Engineering > Electronic engineering

Other information

Authenticus ID: P-000-M9G

DOI: 10.1016/s0263-2241(02)00031-3

Abstract (EN): A method for the in-circuit functional testing of SigmaDelta modulators is described which can be built in large integrated circuits or systems-on-chip. It allows for measuring gain and phase, as well as total harmonic distortion and signal to noise and harmonic distortion ratio parameters. This method can be built in-circuit using existing computational resources, such as digital signal processors or (re)configurable logic, which can therefore be used to implement both mission and test operations. Both simulation and experimental results were obtained which are in close agreement with those expected from the theory.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 8