Publications with the same journal as the Turn-to-Turn Short Circuit Fault Localization in Transformer Winding via Image Processing and Deep Learning Method publication
Group by:
Order:
Another Publication in an International Scientific Journal
I. Estévez-Ayres (Author) (Other); P. Basanta-Val (Author) (Other); M. Garcia-Valls (Author) (Other); J.A Fisteus (Author) (Other); L. Almeida (Author) (FEUP)
Estevez Ayres, I (Author) (Other); Basanta Val, P (Author) (Other); Garcia Valls, M (Author) (Other); Fisteus, JA (Author) (Other); Luis Almeida (Author) (FEUP)
Matthew B. Gough (Author) (Other); Sérgio F. Santos (Author) (Other); Tarek AlSkaif (Author) (Other); Mohammad S. Javadi (Author) (Other); Rui Castro (Author) (Other); João P. S. Catalão (Author) (FEUP)
Marau, R (Author) (Other); Leite, P (Author) (Other); Velasco, M (Author) (Other); Marti, P (Author) (Other); Luis Almeida (Author) (FEUP); Pedreiras, P (Author) (Other); Fuertes, JM (Author) (Other)